Study of the technique of measuring silica oxide films with the optical reflection method, for its possible implementation using low-cost materials
In the following work we are going to describe the operation of an equipment capable of measuring the film thickness of a silicon oxide sample placed on a silicon substrate, this equipment uses an optical characterization technique called spectral reflectance. In order to achieve that, first we addr...
Αποθηκεύτηκε σε:
| Κύριος συγγραφέας: | |
|---|---|
| Μορφή: | bachelorThesis |
| Γλώσσα: | eng |
| Έκδοση: |
2020
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| Θέματα: | |
| Διαθέσιμο Online: | http://repositorio.yachaytech.edu.ec/handle/123456789/288 |
| Ετικέτες: |
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