CRITICAL-POINT YIELD MODEL TO APPRAISE DAMAGE CAUSED BY LEAF BLIGHT IN BEAN CROP

In Ecuador, the bean (Phaseolus vulgaris L.) is consumed by the population majority, and also a source of income for small and medium producers. One of the most important disease is the blight or root rot rhizoctonia, caused by the necrotrophic fungus Rhizoctonia solani Kuhn (teleomorph Thanatephoru...

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書誌詳細
第一著者: Garcés Fiallos, Felipe Rafael (author)
フォーマット: article
言語:eng
出版事項: 2011
主題:
オンライン・アクセス:https://revistas.uteq.edu.ec/index.php/cyt/article/view/99
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