CRITICAL-POINT YIELD MODEL TO APPRAISE DAMAGE CAUSED BY LEAF BLIGHT IN BEAN CROP
In Ecuador, the bean (Phaseolus vulgaris L.) is consumed by the population majority, and also a source of income for small and medium producers. One of the most important disease is the blight or root rot rhizoctonia, caused by the necrotrophic fungus Rhizoctonia solani Kuhn (teleomorph Thanatephoru...
Guardado en:
| Autor principal: | |
|---|---|
| Formato: | article |
| Lenguaje: | eng |
| Publicado: |
2011
|
| Materias: | |
| Acceso en línea: | https://revistas.uteq.edu.ec/index.php/cyt/article/view/99 |
| Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|