CRITICAL-POINT YIELD MODEL TO APPRAISE DAMAGE CAUSED BY LEAF BLIGHT IN BEAN CROP

In Ecuador, the bean (Phaseolus vulgaris L.) is consumed by the population majority, and also a source of income for small and medium producers. One of the most important disease is the blight or root rot rhizoctonia, caused by the necrotrophic fungus Rhizoctonia solani Kuhn (teleomorph Thanatephoru...

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Gorde:
Xehetasun bibliografikoak
Egile nagusia: Garcés Fiallos, Felipe Rafael (author)
Formatua: article
Hizkuntza:eng
Argitaratua: 2011
Gaiak:
Sarrera elektronikoa:https://revistas.uteq.edu.ec/index.php/cyt/article/view/99
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