APA ציטוט

Garcés Fiallos, F. R. (2011). CRITICAL-POINT YIELD MODEL TO APPRAISE DAMAGE CAUSED BY LEAF BLIGHT IN BEAN CROP.

Chicago Style (17th ed.) Citation

Garcés Fiallos, Felipe Rafael. CRITICAL-POINT YIELD MODEL TO APPRAISE DAMAGE CAUSED BY LEAF BLIGHT IN BEAN CROP. 2011.

ציטוט MLA

Garcés Fiallos, Felipe Rafael. CRITICAL-POINT YIELD MODEL TO APPRAISE DAMAGE CAUSED BY LEAF BLIGHT IN BEAN CROP. 2011.